Expression profile for XM_002509090.1 (XM_002509090.1)

Aliases : MICPUN_62884, 62884

Description : Voltage-gated ion channel superfamily

Perturbation / strain specificity : Metal ion/ENP (SPM: 0.71, entropy: 0.0, tau: 0.01)
Sample enrichment: RCC299,Low P,21C (SPM: 0.58, entropy: 2.95, tau: 0.53)

All conditions

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Perturbation / strain specificity

Note: SPM calculations for this profile are done using the maximum value.

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