Expression profile for XM_002507348.1 (XM_002507348.1)

Aliases : MICPUN_55605, 55605

Description : Voltage-gated ion channel superfamily

Perturbation / strain specificity : Metal ion/ENP (SPM: 0.8, entropy: 1.0, tau: 0.26)
Sample enrichment: RCC299,Low P,21C (SPM: 0.63, entropy: 2.64, tau: 0.59)

All conditions

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Perturbation / strain specificity

Note: SPM calculations for this profile are done using the maximum value.

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