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Expression profile for XM_002500574.1 (XM_002500574.1)

Aliases : MICPUN_57158, 57158

Description : CS domain [Interproscan].

Perturbation / strain specificity : Metal ion/ENP (SPM: 0.92, entropy: 1.0, tau: 0.59)
Sample enrichment: RCC299,Low P,21C (SPM: 0.64, entropy: 2.95, tau: 0.65)

All conditions


Perturbation / strain specificity

Note: SPM calculations for this profile are done using the maximum value.